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Tech & White Papers
Multi-patterning technology was introduced at the 20 nm node to overcome lithographic limitations in current IC manufacturing processes. While …
SpyGlass Flow for XILINX FPGA, Atrenta
SpyGlass Lint and CDC are critical analysis tools for RTL designs that identify chip killer problems and shorten design cycle time. This document highlights the issues …
Atrenta SoC Realization, Atrenta, Inc.
This White Paper deals with the way SoCs are designed, a process of substantial complexity. This design process is undergoing significant transformation, …
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