VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
by Laung-Terng Wang , Cheng-Wen Wu , Xiaoqing Wen



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Editorial Reviews
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.



Book Details
  • Media : Hardcover
  • Publisher : Morgan Kaufmann (July 21, 2006)
  • Language : English
  • ISBN : 0123705975
  • Amazon.com Sales Rank : # 2,281,270 in Amazon.com Books Sales

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