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Title : SEICA shows how VIVA extend test coverage of complex boards with DiaTem JTAG tool
Company : TEMENTO Systems
Date : 06-Sep-2011
Downloads : 3

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For a long time ATE companies deliver high quality ICT, Functional and Flying probe Testers. Today’s Electronic trends towards higher density and speed has pushed electronic board testers into an accessibility bottleneck which affects peculiarly the Bed of Nails (BoN). It led ATE companies to allow add-on JTAG testers, using Boundary Scan technique, to restore the declining test coverage. A seamless integration of both technologies is mandatory to make full use of Boundary Scan promise. While Marketers and analysts predict a symbiotic future, SEICA and TEMENTO SYSTEMS demonstrate an efficient integration TODAY.
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