In 2019, the 50th ITC has an unprecedented number of talks by Industry Leaders. We have 6
keynote web page
for details on these, follow us on Twitter, hash tag #itctestweek. Watch your email for more information on each speaker.
for ITC. Remember, early registration ends
Here are the Tuesday Afternoon, November 12, talks. Watch your mail for details on the other talks.
Tuesday Afternoon Keynote
Serge Leef, Program Manager, DARPA
Incorporation of Security into Chip Design
Serge Leef joined DARPA in August 2018 as a program manager in the Microsystems Technology Office (MTO). His research interests include computer architecture, simulation, synthesis, semiconductor intellectual property (IP), cyber-physical modeling, distributed systems, secure design flows, and supply chain management. He is also interested in the facilitation of startup ecosystems and business aspects of technology. Leef came to DARPA from Mentor, a Siemens Business where from 2010 until 2018 he was a Vice President of New Ventures, responsible for identifying and developing technology and business opportunities in systems-oriented markets. Prior to joining Mentor, he was responsible for design automation at Silicon Graphics. He also managed a CAE/CAD organization at Microchip and developed functional and physical design and verification tools for major 8- and 16-bit microcontroller and microprocessor programs at Intel.
Leef received his Bachelor of Science degree in electrical engineering and Master of Science degree in computer science from Arizona State University. He has served on corporate, state, and academic advisory boards, delivered numerous public speeches, and holds two patents
Tuesday Afternoon Visionary Talk
John Kibarian, President & CEO, PDF Solutions
The Outlook for Manufacturing Test in a Future Driven by Big Data Analytics and the IIoT
John Kibarian is the CEO, president, and co-founder of PDF Solutions. Before founding the company in 1991, Dr. Kibarian was a researcher at Carnegie Mellon University's SEMATECH Center for Rapid Yield Learning. At CMU, John developed algorithms for diagnosing process variations based on electrical test data and for achieving yield maximization based on circuit optimization and statistical simulation of processes and devices. Kibarian holds B.S. and M.S. degrees in Electrical Engineering and a Ph.D. in Computer Engineering, all from Carnegie Mellon University.