SUBMIT YOUR PAPER TO THE 2020 ITC!

ITC Will be Held November 3-5
Washington DC
Reminder: ITC Submissions Due March 27

ITC 2020 is welcoming new paper submissions for this year's conference. Last year's 50th anniversary celebration was a great success, and we were thrilled to see so many of you there. This year's conference will be held in Washington D.C. again, and we are looking forward to seeing you there.
 
Paper Registration for ITC 2020 will be closed on  March 27, 2020, with the final pdf due on  April 3, 2020.   
 
If you haven't registered your paper, please do so. Registration of a paper only requires  
(1) authors,  
(2) title,  
(3) a 35-word abstract.   
 
After registration, you can upload the PDF until the cut-off date (April 3).  
 
We thank you for your support of ITC 2020-the first ITC of the second half century!  
 
Also, note that once again there is an industrial short paper track to make practical industry-focused submissions easier and faster. Final papers accepted to this track will be limited to four pages, and an easy template for the initial submission can be found on the ITC website  here
 
Please feel free to circulate all of this info to your friends and colleagues. Thank youI
 
Detailed instructions for submitting papers are at 

More information: 
 
International Test Conference is the world's premier venue dedicated to the electronic test of devices, boards and system - covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. 
 
 
ITC 2020 starts the second half century of the conference. Emerging technologies such as optical, biomedical, and quantum devices will require new test solutions. Artificial Intelligence (AI) and the need for trustworthy devices are providing both new challenges and new opportunities for off-chip and on-chip test. At the same time, more stringent quality requirements, especially in automotive applications, are requiring more efficient test, debug, monitoring, and repair techniques that can transfer to the field.
 
In 2020 we are once again placing special emphasis on the following three areas:
  • Automotive Test
  • Security
  • AI in Test
Each of these will have a special track, with multiple sessions allocated to each topic. We encourage those who work in these areas to submit, and we also encourage submissions on other test areas (including testing of emerging technologies and systems as well as traditional test topics) as found in our  Call for Papers

 
 
For more information on ITC, please visit our  website. Follow @ITCTestWeek on Twitter, hashtag #itctestweek 
 


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