Email this story to a friend:
"Teradyne Announces UltraSerial60G, First Automatic Test Instrument to Test New Generation of Semiconductor Chips for 5G, Artificial Intelligence and Automotive Applications"

*Friend's Email :
*Your Full Name :
*Your Email Address :
Personal Message :
*Security Image :
 Security Image


   
Your IP address is : 3.238.249.17
Aldec

 Advanced Asembly

Featured Video
Latest Blog Posts
Bob Smith, Executive DirectorBridging the Frontier
by Bob Smith, Executive Director
What’s on Tap from the ESD Alliance? Plenty! Read On …
Anupam BakshiAgnisys Automation Review
by Anupam Bakshi
Automating IP and SoC Development
Jobs
Test and Measurement System Architect for Xilinx at San Jose, California
ASIC SoC Verification Engineer for Ericsson at Austin, Texas
Entry Level SOC Verification Engineer for NXP Semiconductors at Austin (Oakhill, Office), Texas
Technical Product Manager- SISW-EDA 238452 for Siemens AG at Fremont, California
Business Operations Planner for Global Foundaries at Santa Clara, California
ASIC Engineer for Amazon at seattle, Washington
Upcoming Events
Simulation World at United States - Apr 20 - 21, 2021
Virtual ASMC 2021 at United States - May 10 - 12, 2021
DVCon China 2021 at Shanghai China - May 26, 2021
CadenceLIVE Americas 2021 at United States - Jun 8 - 9, 2021
True Circuits PHY



© 2021 Internet Business Systems, Inc.
670 Aberdeen Way, Milpitas, CA 95035
+1 (408) 882-6554 — Contact Us, or visit our other sites:
AECCafe - Architectural Design and Engineering TechJobsCafe - Technical Jobs and Resumes GISCafe - Geographical Information Services  MCADCafe - Mechanical Design and Engineering ShareCG - Share Computer Graphic (CG) Animation, 3D Art and 3D Models
  Privacy PolicyAdvertise