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Tarek Badreldin
(Unregistered)
07/19/06 06:34 PM
Address a true need Report this article as Inappropriate to us !!!Login to Reply

Automated Generation of test patterns represents a current true need, not only for DRC but for the more complicated testcases of LVS, where you need to build circuits not shapes. As the number of DRC rules grows, especially for technologies like 45nm, it sometimes take longer time to test the ruledeck by manual creation of testcases than the time needed to develope the ruledeck itself.


Entire thread
SubjectPosted byPosted on
*Automatic Environment for DRC Rule File Development and QA  07/06/06 03:56 AM
.*Sometime this is to be startedRamesh.Nadamuni  09/07/06 11:53 PM
.*Great Idea - But how feasible would it beDave  08/22/06 12:05 AM
.*Good Concept - Reveals a huge gapMatt  08/05/06 04:10 PM
.*Address a true needTarek Badreldin  07/19/06 06:34 PM
.*Interesting article, but what is the means to it?Ahmed Yehia  07/10/06 01:51 PM
.*Good articleAiteen Zhang  07/09/06 04:58 AM
.*Good work but we need moreMohamed Ismail  07/06/06 03:56 AM
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